Focused Ion Beam (FIB) Professional Education Events

Future Events

• 
  FIB SEM 2024: 16th Annual FIB SEM Meeting
  Wednesday, May 22nd & Thursday, May 23rd, 2024 Kossiakoff CenterJohns Hopkins Applied Physics Laboratory, Laurel, MD The FIB SEM 2024 Meeting will be returning to the Kossiakoff Center at the Johns Hopkins Applied Physics Laboratory and will be co-hosted by the Canadian Centre for Electron Microscopy (CCEM).  We will have two full days of presentations, tutorials,… Read more: FIB SEM 2024: 16th Annual FIB SEM Meeting

Past Events

• FIB FIG Winter Quarter Meeting
  January 17, 11am CST Low Budget, No ProblemCutting Big Windows with a Ga FIB Pete Eschbach, PhD.Director Electron Microscope FacilityOregon State University AbstractA hybrid method will be discussed that allows organizations that do not have plasma focused ion beam (FIB) microscopes but do have access… Read more: FIB FIG Winter Quarter Meeting
• M&M 2024 Call for Papers
  The call for papers for Microscopy and Microanalysis 2024 in Cleveland, OH is live! This year the FIB symposium has moved to the cross cutting track C03 ‘Interdisciplinary Analysis of Soft/Hybrid/Bio Materials Using Advanced Focused Ion Beam’ See MSA | M&M Meeting (microscopy.org) for more… Read more: M&M 2024 Call for Papers
• Cryogenic Electron Microscopy of Beam and Air-Sensitive Materials
  FIB FIG Fall Quarterly MeetingOctober 19, 11am CST John Watt, PhDCenter for Integrated NanotechnologiesLos Alamos National Laboratory AbstractAdvances in cryogenic electron microscopy (cryo-EM), primarily driven by the life sciences, have emerged as powerful techniques for the characterization of beam and air sensitive materials. Cryo-EM avoids… Read more: Cryogenic Electron Microscopy of Beam and Air-Sensitive Materials
• Volume Electron Microscopy Approaches and Applications for Life Sciences using Scanning Electron Microscopy
  April 19th, 2023 – 12 pm Eastern Daylight Time Kirk J Czymmek, Advanced Bioimaging Laboratory, Donald Danforth Plant Science Center, Saint Louis, Missouri, USA Volume electron microscopy (vEM) encompasses a group of transmission and scanning electron microscopy imaging strategies that allow extended 3D visualization of… Read more: Volume Electron Microscopy Approaches and Applications for Life Sciences using Scanning Electron Microscopy
• Ion Microscopy, Machining, and Elemental Analysis with the Cesium Low Temperature Ion Source (LoTIS)
  Winter FIB FIG Quarterly Meeting, January 18, 11am CST Presented by Adam Steele, zeroK NanoTech Corporation This talk presents the latest results from focused ion systems employing a Cs+ Low Temperature Ion Source (LoTIS). FIB applications include high resolution imaging, long depth-of-focus imaging, successful circuit edit operations… Read more: <strong>Ion Microscopy, Machining, and Elemental Analysis with the Cesium Low Temperature Ion Source (LoTIS)</strong>